Automated Defect and Correlation Length Analysis of Block Copolymer Thin Film Nanopatterns

per Murphy, Jeffrey N., Harris, Kenneth D., Buriak, Jillian M.
Publicat a PLoS One (2015)

Surface Micropatterning of Uniaxially Oriented Polyethylene Films Using Interference Holography for Strain Sensors

per Shen, Lihua, Lafleur, Sarah S. D., Houben, Simon J. A., Murphy, Jeffrey N., Severn, John R., Bastiaansen, Cees W. M.
Publicat a Langmuir (2017)