Automated Defect and Correlation Length Analysis of Block Copolymer Thin Film Nanopatterns

অনুযায়ী Murphy, Jeffrey N., Harris, Kenneth D., Buriak, Jillian M.
প্রকাশিত PLoS One (2015)

Surface Micropatterning of Uniaxially Oriented Polyethylene Films Using Interference Holography for Strain Sensors

অনুযায়ী Shen, Lihua, Lafleur, Sarah S. D., Houben, Simon J. A., Murphy, Jeffrey N., Severn, John R., Bastiaansen, Cees W. M.
প্রকাশিত Langmuir (2017)