Absolute flatness measurements of silicon mirrors by a three-intersection method by near-infrared interferometry

Por Uchikoshi, Junichi, Hayashi, Yoshinori, Ajari, Noritaka, Kawai, Kentaro, Arima, Kenta, Morita, Mizuho
Publicado em 2013

Metal-assisted chemical etching of Ge(100) surfaces in water toward nanoscale patterning

Por Kawase, Tatsuya, Mura, Atsushi, Dei, Katsuya, Nishitani, Keisuke, Kawai, Kentaro, Uchikoshi, Junichi, Morita, Mizuho, Arima, Kenta
Publicado em 2013