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door Warneke, C., Trainer, M., de Gouw, J.A., Parrish, D.D., Fahey, D.W., Ravishankara, A.R., Middlebrook, A.M., Brock, C.A., Roberts, J.M., Brown, S.S., Neuman, J.A., Lerner, B.M., Lack, D., Law, D., Hübler, G., Pollack, I., Sjostedt, S., Ryerson, T.B., Gilman, J.B., Liao, J., Holloway, J., Peischl, J., Nowak, J.B., Aikin, K., Min, K.-E., Washenfelder, R.A., Graus, M.G., Richardson, M., Markovic, M.Z., Wagner, N.L., Welti, A., Veres, P.R., Edwards, P., Schwarz, J.P., Gordon, T., Dube, W.P., McKeen, S., Brioude, J., Ahmadov, R., Bougiatioti, A., Lin, J.J., Nenes, A., Wolfe, G.M., Hanisco, T.F., Lee, B.H., Lopez-Hilfiker, F.D., Thornton, J.A., Keutsch, F.N., Kaiser, J., Mao, J., Hatch, C.
Gepubliceerd in Atmos Meas Tech (2016)
Volledige tekstGepubliceerd in Atmos Meas Tech (2016)
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