Direct Determination of 3D Distribution of Elemental Composition in Single Semiconductor Nanoislands by Scanning Auger Microscopy

nork Ponomaryov, Semyon S., Yukhymchuk, Volodymyr O., Lytvyn, Peter M., Valakh, Mykhailo Ya
Argitaratua izan da Nanoscale Res Lett (2016)

Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force Microscopy

nork Slobodian, Oleksandr M., Lytvyn, Peter M., Nikolenko, Andrii S., Naseka, Victor M., Khyzhun, Oleg Yu., Vasin, Andrey V., Sevostianov, Stanislav V., Nazarov, Alexei N.
Argitaratua izan da Nanoscale Res Lett (2018)