PLL VHDL digital integrated circuits n/a radiation effects radiation hardening radiation hardening by design radiation hardening by design (RHBD) single event effects single event upset soft error thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBX History of engineering and technology total ionizing dose total ionizing dose (TID) 22-nm FD SOI 28-nm FD SOI 4MR 65 nm CMOS technology All-Digital CDR CMOS CMOS analog integrated circuits Co-60 Co-60 gamma radiation D Flip-Flop D-type flip-flop FMR FPGA FPGA-based digital controller Image processing