Versailles Project on Advanced Materials and Standards Interlaboratory Study on Measuring the Thickness and Chemistry of Nanoparticle Coatings Using XPS and LEIS

Yazar: Belsey, Natalie A., Cant, David J. H., Minelli, Caterina, Araujo, Joyce R., Bock, Bernd, Brüner, Philipp, Castner, David G., Ceccone, Giacomo, Counsell, Jonathan D. P., Dietrich, Paul M., Engelhard, Mark H., Fearn, Sarah, Galhardo, Carlos E., Kalbe, Henryk, Won Kim, Jeong, Lartundo-Rojas, Luis, Luftman, Henry S., Nunney, Tim S., Pseiner, Johannes, Smith, Emily F., Spampinato, Valentina, Sturm, Jacobus M., Thomas, Andrew G., Treacy, Jon P.W., Veith, Lothar, Wagstaffe, Michael, Wang, Hai, Wang, Meiling, Wang, Yung-Chen, Werner, Wolfgang, Yang, Li, Shard, Alexander G.
Yayımlandı J Phys Chem C Nanomater Interfaces (2016)