Defect Structure Determination of GaN Films in GaN/AlN/Si Heterostructures by HR-TEM, XRD, and Slow Positrons Experiments

Por Vladimir Lucian Ene, Doru Dinescu, Nikolay Djourelov, Iulia Zai, Bogdan Stefan Vasile, Andreea Bianca Serban, Victor Leca, Ecaterina Andronescu
Publicado em 2020-01-01