Maskless Lithography and in situ Visualization of Conductivity of Graphene using Helium Ion Microscopy

Por Iberi, Vighter, Vlassiouk, Ivan, Zhang, X.-G., Matola, Brad, Linn, Allison, Joy, David C., Rondinone, Adam J.
Publicado no Sci Rep (2015)

Chemical Changes in Layered Ferroelectric Semiconductors Induced by Helium Ion Beam

Por Belianinov, Alex, Burch, Matthew J., Hysmith, Holland E., Ievlev, Anton V., Iberi, Vighter, Susner, Michael A., McGuire, Michael A., Maksymovych, Peter, Chyasnavichyus, Marius, Jesse, Stephen, Ovchinnikova, Olga S.
Publicado no Sci Rep (2017)

Nanoforging Single Layer MoSe(2) Through Defect Engineering with Focused Helium Ion Beams

Por Iberi, Vighter, Liang, Liangbo, Ievlev, Anton V., Stanford, Michael G., Lin, Ming-Wei, Li, Xufan, Mahjouri-Samani, Masoud, Jesse, Stephen, Sumpter, Bobby G., Kalinin, Sergei V., Joy, David C., Xiao, Kai, Belianinov, Alex, Ovchinnikova, Olga S.
Publicado no Sci Rep (2016)