Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics

Por Gorfman, S., Simons, H., Iamsasri, T., Prasertpalichat, S., Cann, D. P., Choe, H., Pietsch, U., Watier, Y., Jones, J. L.
Publicado no Sci Rep (2016)