Operational stability of solution based zinc tin oxide/SiO2 thin film transistors under gate bias stress

অনুযায়ী Asal Kiazadeh, Daniela Salgueiro, Rita Branquinho, Joana Pinto, Henrique L. Gomes, Pedro Barquinha, Rodrigo Martins, Elvira Fortunato
প্রকাশিত 2015-06-01