Site-selective spectroscopy with depth resolution using resonant x-ray reflectometry

Por Hamann-Borrero, J. E., Macke, S., Gray, B., Kareev, M., Schierle, E., Partzsch, S., Zwiebler, M., Treske, U., Koitzsch, A., Büchner, B., Freeland, J. W., Chakhalian, J., Geck, J.
Publicado no Sci Rep (2017)