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Por Caughey, Aaron B, Sundaram, Vandana, Kaimal, Anjali J, Cheng, Yvonne W, Gienger, Allison, Little, Sarah E, Lee, Jason F, Wong, Luchin, Shaffer, Brian L, Tran, Susan H, Padula, Amy, McDonald, Kathryn M, Long, Elisa F, Owens, Douglas K, Bravata, Dena M
Publicado no Evid Rep Technol Assess (Full Rep) (2009)
Obter o texto integralPublicado no Evid Rep Technol Assess (Full Rep) (2009)
Obter o texto integral
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