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Por Berkman, N D, Thorp, J M, Hartmann, K E, Lohr, K N, Idicula, A E, McPheeters, M, Gavin, N I, Carey, T S, Tolleson-Rinehart, S, Jackman, A M, Hasselblad, V, Puckett, E C
Publicado no Evid Rep Technol Assess (Summ) (2000)
Obter o texto integralPublicado no Evid Rep Technol Assess (Summ) (2000)
Obter o texto integral
Artigo