Resonance Raman scattering: nondestructive and noninvasive technique for structural and electronic characterization of isolated single-wall carbon nanotubes

Por A. Jorio, F. M. Matinaga, A. Righi, M. S. S. Dantas, M. A. Pimenta, A. G. Souza Filho, J. Mendes Filho, J. H. Hafner, C. M. Lieber, R. Saito, G. Dresselhaus, M. S. Dresselhaus
Publicado no Brazilian Journal of Physics (2002)