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Por Hartmann, Katherine E, McPheeters, Melissa L, Biller, Danie H, Ward, Renée M, McKoy, J Nikki, Jerome, Rebecca N, Micucci, Sandra R, Meints, Laura, Fisher, Jill A, Scott, Theresa A, Slaughter, James C, Blume, Jeffrey D
Publicado no Evid Rep Technol Assess (Full Rep) (2009)
Obter o texto integralPublicado no Evid Rep Technol Assess (Full Rep) (2009)
Obter o texto integral
Artigo