Increased Localization Precision by Interference Fringe Analysis

Por Ebeling, Carl G., Meiri, Amihai, Martineau, Jason, Zalevsky, Zeev, Gerton, Jordan M., Menon, Rajesh
Publicado no Nanoscale (2015)

Improved localization accuracy in stochastic super-resolution fluorescence microscopy by K-factor image deshadowing

Por Ilovitsh, Tali, Meiri, Amihai, Ebeling, Carl G., Menon, Rajesh, Gerton, Jordan M., Jorgensen, Erik M., Zalevsky, Zeev
Publicado em 2013

K-factor image deshadowing for three-dimensional fluorescence microscopy

Por Ilovitsh, Tali, Weiss, Aryeh, Meiri, Amihai, Ebeling, Carl G., Amiel, Aliza, Katz, Hila, Mannasse-Green, Batya, Zalevsky, Zeev
Publicado no Sci Rep (2015)