Effects of Vacuum Annealing on the Conduction Characteristics of ZnO Nanosheets

Por Barnett, Chris J., Smith, Nathan A., Jones, Daniel R., Maffeis, Thierry G. G., Cobley, Richard J.
Publicado no Nanoscale Res Lett (2015)

Nondestructive Method for Mapping Metal Contact Diffusion in In(2)O(3) Thin-Film Transistors

Por Kryvchenkova, Olga, Abdullah, Isam, Macdonald, John Emyr, Elliott, Martin, Anthopoulos, Thomas D., Lin, Yen-Hung, Igić, Petar, Kalna, Karol, Cobley, Richard J.
Publicado no ACS Appl Mater Interfaces (2016)