Effect of Si on the Energy Band Gap Modulation and Performance of Silicon Indium Zinc Oxide Thin-Film Transistors

Por Choi, Jun Young, Heo, Keun, Cho, Kyung-Sang, Hwang, Sung Woo, Chung, JaeGwan, Kim, Sangsig, Lee, Byeong Hyeon, Lee, Sang Yeol
Publicado no Sci Rep (2017)

Degradation by water vapor of hydrogenated amorphous silicon oxynitride films grown at low temperature

Por Lee, Hyung-Ik, Park, Jong-Bong, Xianyu, Wenxu, Kim, Kihong, Chung, Jae Gwan, Kyoung, Yong Koo, Byun, Sunjung, Yang, Woo Young, Park, Yong Young, Kim, Seong Min, Cho, Eunae, Shin, Jai Kwang
Publicado no Sci Rep (2017)

Anion control as a strategy to achieve high-mobility and high-stability oxide thin-film transistors

Por Kim, Hyun-Suk, Jeon, Sang Ho, Park, Joon Seok, Kim, Tae Sang, Son, Kyoung Seok, Seon, Jong-Baek, Seo, Seok-Jun, Kim, Sun-Jae, Lee, Eunha, Chung, Jae Gwan, Lee, Hyungik, Han, Seungwu, Ryu, Myungkwan, Lee, Sang Yoon, Kim, Kinam
Publicado em 2013

Defect visualization of Cu(InGa)(SeS)(2) thin films using DLTS measurement

Por Heo, Sung, Chung, JaeGwan, Lee, Hyung-Ik, Lee, Junho, Park, Jong-Bong, Cho, Eunae, Kim, KiHong, Kim, Seong Heon, Park, Gyeong Su, Lee, Dongho, Lee, Jaehan, Nam, Junggyu, Yang, JungYup, Lee, Dongwha, Cho, Hoon Young, Kang, Hee Jae, Choi, Pyung-Ho, Choi, Byoung-Deog
Publicado no Sci Rep (2016)