Surface plasmon enhanced Organic color image sensor with Ag nanoparticles coated with silicon oxynitride

nork Heo, Sung, lee, Jooho, Lee, Gae Hwang, Heo, Chul-Joon, Kim, Seong Heon, Yun, Dong-Jin, Park, Jong-Bong, Kim, Kihong, Kim, Yongsung, Lee, Dongwook, Park, Gyeong-Su, Cho, Hoon Young, Shin, Taeho, Yun, Sung Young, Kim, Sunghan, Jin, Yong Wan, Park, Kyung-Bae
Argitaratua izan da Sci Rep (2020)

Author Correction: Surface plasmon enhanced Organic color image sensor with Ag nanoparticles coated with silicon oxynitride

nork Heo, Sung, Lee, Jooho, Lee, Gae Hwang, Heo, Chul-Joon, Kim, Seong Heon, Yun, Dong-Jin, Park, Jong-Bong, Kim, Kihong, Kim, Yongsung, Lee, Dongwook, Park, Gyeong-Su, Cho, Hoon Young, Shin, Taeho, Yun, Sung Young, Kim, Sunghan, Jin, Yong Wan, Park, Kyung-Bae
Argitaratua izan da Sci Rep (2020)

Defect visualization of Cu(InGa)(SeS)(2) thin films using DLTS measurement

nork Heo, Sung, Chung, JaeGwan, Lee, Hyung-Ik, Lee, Junho, Park, Jong-Bong, Cho, Eunae, Kim, KiHong, Kim, Seong Heon, Park, Gyeong Su, Lee, Dongho, Lee, Jaehan, Nam, Junggyu, Yang, JungYup, Lee, Dongwha, Cho, Hoon Young, Kang, Hee Jae, Choi, Pyung-Ho, Choi, Byoung-Deog
Argitaratua izan da Sci Rep (2016)