Comparative Study on Statistical-Variation Tolerance Between Complementary Crossbar and Twin Crossbar of Binary Nano-scale Memristors for Pattern Recognition

Por Truong, Son Ngoc, Shin, SangHak, Byeon, Sang-Don, Song, JaeSang, Mo, Hyun-Sun, Min, Kyeong-Sik
Publicado no Nanoscale Res Lett (2015)