Amorphous Ge-Bi-Se Thin Films: A Mass Spectrometric Study

por Mawale, Ravi, Mandal, Govinda, Bouška, Marek, Gutwirth, Jan, Bora, Pankaj Lochan, Nazabal, Virginie, Havel, Josef, Němec, Petr
Publicado no Sci Rep (2019)

Spectroscopic Ellipsometry Characterization of As-Deposited and Annealed Non-Stoichiometric Indium Zinc Tin Oxide Thin Film

por Janicek, Petr, Putri, Maryane, Kim, Ki Hwan, Lee, Hye Ji, Bouska, Marek, Šlang, Stanislav, Lee, Hee Young
Publicado no Materials (Basel) (2021)

Mass spectrometric investigation of amorphous Ga-Sb-Se thin films

por Mawale, Ravi, Halenkovič, Tomáš, Bouška, Marek, Gutwirth, Jan, Nazabal, Virginie, Bora, Pankaj Lochan, Pečinka, Lukáš, Prokeš, Lubomír, Havel, Josef, Němec, Petr
Publicado no Sci Rep (2019)

Comparative study of Er(3+)-doped Ga-Ge-Sb-S thin films fabricated by sputtering and pulsed laser deposition

por Normani, Simone, Louvet, Geoffrey, Baudet, Emeline, Bouška, Marek, Gutwirth, Jan, Starecki, Florent, Doualan, Jean-Louis, Ledemi, Yannick, Messaddeq, Younes, Adam, Jean-Luc, Němec, Petr, Nazabal, Virginie
Publicado no Sci Rep (2020)