Amorphous Ge-Bi-Se Thin Films: A Mass Spectrometric Study

od Mawale, Ravi, Mandal, Govinda, Bouška, Marek, Gutwirth, Jan, Bora, Pankaj Lochan, Nazabal, Virginie, Havel, Josef, Němec, Petr
Wydane w Sci Rep (2019)

Spectroscopic Ellipsometry Characterization of As-Deposited and Annealed Non-Stoichiometric Indium Zinc Tin Oxide Thin Film

od Janicek, Petr, Putri, Maryane, Kim, Ki Hwan, Lee, Hye Ji, Bouska, Marek, Šlang, Stanislav, Lee, Hee Young
Wydane w Materials (Basel) (2021)

Mass spectrometric investigation of amorphous Ga-Sb-Se thin films

od Mawale, Ravi, Halenkovič, Tomáš, Bouška, Marek, Gutwirth, Jan, Nazabal, Virginie, Bora, Pankaj Lochan, Pečinka, Lukáš, Prokeš, Lubomír, Havel, Josef, Němec, Petr
Wydane w Sci Rep (2019)

Comparative study of Er(3+)-doped Ga-Ge-Sb-S thin films fabricated by sputtering and pulsed laser deposition

od Normani, Simone, Louvet, Geoffrey, Baudet, Emeline, Bouška, Marek, Gutwirth, Jan, Starecki, Florent, Doualan, Jean-Louis, Ledemi, Yannick, Messaddeq, Younes, Adam, Jean-Luc, Němec, Petr, Nazabal, Virginie
Wydane w Sci Rep (2020)