Amorphous Ge-Bi-Se Thin Films: A Mass Spectrometric Study

von Mawale, Ravi, Mandal, Govinda, Bouška, Marek, Gutwirth, Jan, Bora, Pankaj Lochan, Nazabal, Virginie, Havel, Josef, Němec, Petr
Veröffentlicht in Sci Rep (2019)

Spectroscopic Ellipsometry Characterization of As-Deposited and Annealed Non-Stoichiometric Indium Zinc Tin Oxide Thin Film

von Janicek, Petr, Putri, Maryane, Kim, Ki Hwan, Lee, Hye Ji, Bouska, Marek, Šlang, Stanislav, Lee, Hee Young
Veröffentlicht in Materials (Basel) (2021)

Mass spectrometric investigation of amorphous Ga-Sb-Se thin films

von Mawale, Ravi, Halenkovič, Tomáš, Bouška, Marek, Gutwirth, Jan, Nazabal, Virginie, Bora, Pankaj Lochan, Pečinka, Lukáš, Prokeš, Lubomír, Havel, Josef, Němec, Petr
Veröffentlicht in Sci Rep (2019)

Comparative study of Er(3+)-doped Ga-Ge-Sb-S thin films fabricated by sputtering and pulsed laser deposition

von Normani, Simone, Louvet, Geoffrey, Baudet, Emeline, Bouška, Marek, Gutwirth, Jan, Starecki, Florent, Doualan, Jean-Louis, Ledemi, Yannick, Messaddeq, Younes, Adam, Jean-Luc, Němec, Petr, Nazabal, Virginie
Veröffentlicht in Sci Rep (2020)