Thirty per cent contrast in secondary-electron imaging by scanning field-emission microscopy

Yazar: Zanin, D. A., De Pietro, L. G., Peter, Q., Kostanyan, A., Cabrera, H., Vindigni, A., Bähler, Th., Pescia, D., Ramsperger, U.
Yayımlandı Proc Math Phys Eng Sci (2016)