Thirty per cent contrast in secondary-electron imaging by scanning field-emission microscopy

door Zanin, D. A., De Pietro, L. G., Peter, Q., Kostanyan, A., Cabrera, H., Vindigni, A., Bähler, Th., Pescia, D., Ramsperger, U.
Gepubliceerd in Proc Math Phys Eng Sci (2016)