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PHYSICS AND SIMULATION OF VARIOUS MICRO- AND NANOELECTRONIC DEVICES
Temperature characteristics of silicon photoelectronic multipliers

STRUCTURE, MORPHOLOGY AND ELECTRICAL PROPERTIES OF TRANSPARENT NANOMESHY ALUMINUM FILMS
THE OPTICAL PROPERTIES OF ANODIC ALUMINA SUBSTRATES AS THE BASIS OF THRESHOLD DETECTORS

EQUIPMENT FOR NONDESTRUCTIVE TESTING OF SILICON WAFERS SUBMICRON TOPOLOGY DURING THE FABRICATION OF INTEGRATED CIRCUITS
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