Kim, F. H., Pintar, A. L., Moylan, S. P., & Garboczi, E. J. (2019). The Influence of X-Ray Computed Tomography Acquisition Parameters on Image Quality and Probability of Detection of Additive Manufacturing Defects. J Manuf Sci Eng.
Citación estilo ChicagoKim, Felix H., Adam L. Pintar, Shawn P. Moylan, y Edward J. Garboczi. "The Influence of X-Ray Computed Tomography Acquisition Parameters On Image Quality and Probability of Detection of Additive Manufacturing Defects." J Manuf Sci Eng 2019.
Cita MLAKim, Felix H., Adam L. Pintar, Shawn P. Moylan, y Edward J. Garboczi. "The Influence of X-Ray Computed Tomography Acquisition Parameters On Image Quality and Probability of Detection of Additive Manufacturing Defects." J Manuf Sci Eng 2019.