Castro, R., Spivak, Y., Shevchenko, S., & Moshnikov, V. (2021). Low-Frequency Dielectric Relaxation in Structures Based on Macroporous Silicon with Meso-Macroporous Skin-Layer. Materials (Basel).
Citação norma ChicagoCastro, Rene, Yulia Spivak, Sergey Shevchenko, and Vyacheslav Moshnikov. "Low-Frequency Dielectric Relaxation in Structures Based On Macroporous Silicon With Meso-Macroporous Skin-Layer." Materials (Basel) 2021.
Citação norma MLACastro, Rene, Yulia Spivak, Sergey Shevchenko, and Vyacheslav Moshnikov. "Low-Frequency Dielectric Relaxation in Structures Based On Macroporous Silicon With Meso-Macroporous Skin-Layer." Materials (Basel) 2021.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.