Deismireacht APA

Ha Lee, K., Rondeau, V., & Haneuse, S. (2017). Accelerated Failure Time Models for Semi-Competing Risks Data in the Presence of Complex Censoring. Biometrics.

Citação norma Chicago

Ha Lee, Kyu, Virginie Rondeau, and Sebastien Haneuse. "Accelerated Failure Time Models for Semi-Competing Risks Data in the Presence of Complex Censoring." Biometrics 2017.

Deismireacht MLA

Ha Lee, Kyu, Virginie Rondeau, and Sebastien Haneuse. "Accelerated Failure Time Models for Semi-Competing Risks Data in the Presence of Complex Censoring." Biometrics 2017.

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