Zhang, H., Liu, D., Lee, J., Chen, H., Kim, E., Shen, X., . . . Kim, J. (2021). Anisotropic, Wrinkled, and Crack-Bridging Structure for Ultrasensitive, Highly Selective Multidirectional Strain Sensors. Nanomicro Lett.
Citación estilo ChicagoZhang, Heng, Dan Liu, Jeng-Hun Lee, Haomin Chen, Eunyoung Kim, Xi Shen, Qingbin Zheng, Jinglei Yang, and Jang-Kyo Kim. "Anisotropic, Wrinkled, and Crack-Bridging Structure for Ultrasensitive, Highly Selective Multidirectional Strain Sensors." Nanomicro Lett 2021.
Cita MLAZhang, Heng, et al. "Anisotropic, Wrinkled, and Crack-Bridging Structure for Ultrasensitive, Highly Selective Multidirectional Strain Sensors." Nanomicro Lett 2021.
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