Iqbal, H. F., Ai, Q., Thorley, K. J., Chen, H., McCulloch, I., Risko, C., . . . Jurchescu, O. D. (2021). Suppressing bias stress degradation in high performance solution processed organic transistors operating in air. Nat Commun.
Citação norma ChicagoIqbal, Hamna F., Qianxiang Ai, Karl J. Thorley, Hu Chen, Iain McCulloch, Chad Risko, John E. Anthony, and Oana D. Jurchescu. "Suppressing Bias Stress Degradation in High Performance Solution Processed Organic Transistors Operating in Air." Nat Commun 2021.
MLA citiranjeIqbal, Hamna F., et al. "Suppressing Bias Stress Degradation in High Performance Solution Processed Organic Transistors Operating in Air." Nat Commun 2021.
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