APA Alıntı

Funke, S., Duwe, M., Balzer, F., Thiesen, P. H., Hingerl, K., & Schiek, M. (2021). Determining the Dielectric Tensor of Microtextured Organic Thin Films by Imaging Mueller Matrix Ellipsometry. J Phys Chem Lett.

Chicago Stili Alıntı

Funke, Sebastian, Matthias Duwe, Frank Balzer, Peter H. Thiesen, Kurt Hingerl, ve Manuela Schiek. "Determining the Dielectric Tensor of Microtextured Organic Thin Films By Imaging Mueller Matrix Ellipsometry." J Phys Chem Lett 2021.

MLA Alıntı

Funke, Sebastian, et al. "Determining the Dielectric Tensor of Microtextured Organic Thin Films By Imaging Mueller Matrix Ellipsometry." J Phys Chem Lett 2021.