Kim, E., Lee, J., Noh, S., Kwon, O., & Mun, J. Y. (2020). Double staining method for array tomography using scanning electron microscopy. Appl Microsc.
Citación estilo ChicagoKim, Eunjin, Jiyoung Lee, Seulgi Noh, Ohkyung Kwon, y Ji Young Mun. "Double Staining Method for Array Tomography Using Scanning Electron Microscopy." Appl Microsc 2020.
Cita MLAKim, Eunjin, et al. "Double Staining Method for Array Tomography Using Scanning Electron Microscopy." Appl Microsc 2020.
Precaución: Estas citas no son 100% exactas.