Lu, X. (2021). Simulation of infrared spectra of trace impurities in silicon wafers based on the multiple transmission–reflection infrared method. Sci Rep.
Citación estilo ChicagoLu, Xiaobin. "Simulation of Infrared Spectra of Trace Impurities in Silicon Wafers Based On the Multiple Transmission–reflection Infrared Method." Sci Rep 2021.
Cita MLALu, Xiaobin. "Simulation of Infrared Spectra of Trace Impurities in Silicon Wafers Based On the Multiple Transmission–reflection Infrared Method." Sci Rep 2021.
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