Li, Q., Pan, Z., Gao, Y., Li, T., Liang, J., Zhang, Z., . . . Yu, M. (2020). Quantitative Trait Locus (QTLs) Mapping for Quality Traits of Wheat Based on High Density Genetic Map Combined With Bulked Segregant Analysis RNA-seq (BSR-Seq) Indicates That the Basic 7S Globulin Gene Is Related to Falling Number. Front Plant Sci.
Styl ChicagoLi, Qiao, et al. "Quantitative Trait Locus (QTLs) Mapping for Quality Traits of Wheat Based On High Density Genetic Map Combined With Bulked Segregant Analysis RNA-seq (BSR-Seq) Indicates That the Basic 7S Globulin Gene Is Related to Falling Number." Front Plant Sci 2020.
Citace podle MLALi, Qiao, et al. "Quantitative Trait Locus (QTLs) Mapping for Quality Traits of Wheat Based On High Density Genetic Map Combined With Bulked Segregant Analysis RNA-seq (BSR-Seq) Indicates That the Basic 7S Globulin Gene Is Related to Falling Number." Front Plant Sci 2020.