Yamada, J., Inoue, T., Nakamura, N., Kameshima, T., Yamauchi, K., Matsuyama, S., & Yabashi, M. (2020). X-Ray Single-Grating Interferometry for Wavefront Measurement and Correction of Hard X-Ray Nanofocusing Mirrors. Sensors (Basel).
Style de citation ChicagoYamada, Jumpei, Takato Inoue, Nami Nakamura, Takashi Kameshima, Kazuto Yamauchi, Satoshi Matsuyama, et Makina Yabashi. "X-Ray Single-Grating Interferometry for Wavefront Measurement and Correction of Hard X-Ray Nanofocusing Mirrors." Sensors (Basel) 2020.
Style de citation MLAYamada, Jumpei, et al. "X-Ray Single-Grating Interferometry for Wavefront Measurement and Correction of Hard X-Ray Nanofocusing Mirrors." Sensors (Basel) 2020.
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