Ceponis, T., Lastovskii, S., Makarenko, L., Pavlov, J., Pukas, K., & Gaubas, E. (2020). Study of Radiation-Induced Defects in p-Type Si(1−x)Ge(x) Diodes before and after Annealing. Materials (Basel).

Ceponis, Tomas, Stanislau Lastovskii, Leonid Makarenko, Jevgenij Pavlov, Kornelijus Pukas, and Eugenijus Gaubas. "Study of Radiation-Induced Defects in P-Type Si(1−x)Ge(x) Diodes Before and After Annealing." Materials (Basel) 2020.

Ceponis, Tomas, et al. "Study of Radiation-Induced Defects in P-Type Si(1−x)Ge(x) Diodes Before and After Annealing." Materials (Basel) 2020.