APA citiranje

Xue, L., Luo, H., Diao, Q., Yang, F., Wang, J., & Li, Z. (2020). Quantitative X-ray Channel-Cut Crystal Diffraction Wavefront Metrology Using the Speckle Scanning Technique. Sensors (Basel).

Citação norma Chicago

Xue, Lian, Hongxin Luo, Qianshun Diao, Fugui Yang, Jie Wang, and Zhongliang Li. "Quantitative X-ray Channel-Cut Crystal Diffraction Wavefront Metrology Using the Speckle Scanning Technique." Sensors (Basel) 2020.

MLA citiranje

Xue, Lian, et al. "Quantitative X-ray Channel-Cut Crystal Diffraction Wavefront Metrology Using the Speckle Scanning Technique." Sensors (Basel) 2020.