Parlanti, P., Pal-Ghosh, S., Williams, A., Tadvalkar, G., Popratiloff, A., & Stepp, M. A. (2020). Axonal debris accumulates in corneal epithelial cells after intraepithelial corneal nerves are damaged: A focused Ion Beam Scanning Electron Microscopy (FIB-SEM) study. Exp Eye Res.

Parlanti, Paola, Sonali Pal-Ghosh, Alexa Williams, Gauri Tadvalkar, Anastas Popratiloff, och Mary Ann Stepp. "Axonal Debris Accumulates in Corneal Epithelial Cells After Intraepithelial Corneal Nerves Are Damaged: A Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) Study." Exp Eye Res 2020.

Parlanti, Paola, et al. "Axonal Debris Accumulates in Corneal Epithelial Cells After Intraepithelial Corneal Nerves Are Damaged: A Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) Study." Exp Eye Res 2020.