Koshi, T., Nomura, K., & Yoshida, M. (2020). Electrical Characterization of a Double-Layered Conductive Pattern with Different Crack Configurations for Durable E-Textiles. Micromachines (Basel).
Chicago Style CitationKoshi, Tomoya, Ken-ichi Nomura, i Manabu Yoshida. "Electrical Characterization of a Double-Layered Conductive Pattern With Different Crack Configurations for Durable E-Textiles." Micromachines (Basel) 2020.
Cita MLAKoshi, Tomoya, Ken-ichi Nomura, i Manabu Yoshida. "Electrical Characterization of a Double-Layered Conductive Pattern With Different Crack Configurations for Durable E-Textiles." Micromachines (Basel) 2020.
Atenció: Aquestes cites poden no estar 100% correctes.