Kim, D., Oh, Y., Kim, J. U., Lee, S., Baucour, A., Shin, J., . . . Seo, M. (2020). Extreme anti-reflection enhanced magneto-optic Kerr effect microscopy. Nat Commun.
Citação norma ChicagoKim, Dongha, Young-Wan Oh, Jong Uk Kim, Soogil Lee, Arthur Baucour, Jonghwa Shin, Kab-Jin Kim, Byong-Guk Park, and Min-Kyo Seo. "Extreme Anti-reflection Enhanced Magneto-optic Kerr Effect Microscopy." Nat Commun 2020.
MLA CitationKim, Dongha, et al. "Extreme Anti-reflection Enhanced Magneto-optic Kerr Effect Microscopy." Nat Commun 2020.
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