Nolta, N. F., Ghelich, P., Ersöz, A., & Han, M. (2020). Fabrication and modeling of recessed traces for silicon-based neural microelectrodes. J Neural Eng.
Citação norma ChicagoNolta, Nicholas F., Pejman Ghelich, Alpaslan Ersöz, and Martin Han. "Fabrication and Modeling of Recessed Traces for Silicon-based Neural Microelectrodes." J Neural Eng 2020.
Citação norma MLANolta, Nicholas F., Pejman Ghelich, Alpaslan Ersöz, and Martin Han. "Fabrication and Modeling of Recessed Traces for Silicon-based Neural Microelectrodes." J Neural Eng 2020.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.