Lanza, M., Smets, Q., Huyghebaert, C., & Li, L. (2020). Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices. Nat Commun.
Chicago ZitierstilLanza, Mario, Quentin Smets, Cedric Huyghebaert, und Lain-Jong Li. "Yield, Variability, Reliability, and Stability of Two-dimensional Materials Based Solid-state Electronic Devices." Nat Commun 2020.
MLA ZitierstilLanza, Mario, Quentin Smets, Cedric Huyghebaert, und Lain-Jong Li. "Yield, Variability, Reliability, and Stability of Two-dimensional Materials Based Solid-state Electronic Devices." Nat Commun 2020.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.