Diao, G., Zeng, D., Hu, K., & Ibrahim, J. G. (2019). Semi parametric frailty models for zero-inflated event count data in the presence of informative dropout. Biometrics.
Styl ChicagoDiao, Guoqing, Donglin Zeng, Kuolung Hu, a Joseph G. Ibrahim. "Semi Parametric Frailty Models for Zero-inflated Event Count Data in the Presence of Informative Dropout." Biometrics 2019.
Citace podle MLADiao, Guoqing, Donglin Zeng, Kuolung Hu, a Joseph G. Ibrahim. "Semi Parametric Frailty Models for Zero-inflated Event Count Data in the Presence of Informative Dropout." Biometrics 2019.
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