APA Zitierstil

Krawczyk, M., Pisarek, M., Szoszkiewicz, R., & Jablonski, A. (2020). Surface Characterization of MoS(2) Atomic Layers Mechanically Exfoliated on a Si Substrate. Materials (Basel).

Chicago Zitierstil

Krawczyk, Mirosław, Marcin Pisarek, Robert Szoszkiewicz, und Aleksander Jablonski. "Surface Characterization of MoS(2) Atomic Layers Mechanically Exfoliated On a Si Substrate." Materials (Basel) 2020.

MLA Zitierstil

Krawczyk, Mirosław, Marcin Pisarek, Robert Szoszkiewicz, und Aleksander Jablonski. "Surface Characterization of MoS(2) Atomic Layers Mechanically Exfoliated On a Si Substrate." Materials (Basel) 2020.

Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.