Chang, Y., Wang, Y., Chen, Y., & Lin, D. (2020). Facile and Reliable Thickness Identification of Atomically Thin Dichalcogenide Semiconductors Using Hyperspectral Microscopy. Nanomaterials (Basel).
シカゴスタイル引用形Chang, Yu-Chung, Yu-Kai Wang, Yen-Ting Chen, , Der-Yuh Lin. "Facile and Reliable Thickness Identification of Atomically Thin Dichalcogenide Semiconductors Using Hyperspectral Microscopy." Nanomaterials (Basel) 2020.
MLA引用形式Chang, Yu-Chung, Yu-Kai Wang, Yen-Ting Chen, , Der-Yuh Lin. "Facile and Reliable Thickness Identification of Atomically Thin Dichalcogenide Semiconductors Using Hyperspectral Microscopy." Nanomaterials (Basel) 2020.
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