Nikravesh, S., Ryu, D., & Shen, Y. (2020). Instabilities of Thin Films on a Compliant Substrate: Direct Numerical Simulations from Surface Wrinkling to Global Buckling. Sci Rep.
Citação norma ChicagoNikravesh, Siavash, Donghyeon Ryu, and Yu-Lin Shen. "Instabilities of Thin Films On a Compliant Substrate: Direct Numerical Simulations From Surface Wrinkling to Global Buckling." Sci Rep 2020.
Citação norma MLANikravesh, Siavash, Donghyeon Ryu, and Yu-Lin Shen. "Instabilities of Thin Films On a Compliant Substrate: Direct Numerical Simulations From Surface Wrinkling to Global Buckling." Sci Rep 2020.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.