Matsuya, Y., Nakano, T., Kai, T., Shikazono, N., Akamatsu, K., Yoshii, Y., & Sato, T. (2020). A Simplified Cluster Analysis of Electron Track Structure for Estimating Complex DNA Damage Yields. Int J Mol Sci.
シカゴスタイル引用形Matsuya, Yusuke, Toshiaki Nakano, Takeshi Kai, Naoya Shikazono, Ken Akamatsu, Yuji Yoshii, , Tatsuhiko Sato. "A Simplified Cluster Analysis of Electron Track Structure for Estimating Complex DNA Damage Yields." Int J Mol Sci 2020.
MLA引用形式Matsuya, Yusuke, et al. "A Simplified Cluster Analysis of Electron Track Structure for Estimating Complex DNA Damage Yields." Int J Mol Sci 2020.
警告: この引用は必ずしも正確ではありません.