Citazione APA

Nikolaev, K. V., Soltwisch, V., Hönicke, P., Scholze, F., de la Rie, J., Yakunin, S. N., . . . Bijkerk, F. (2020). A semi-analytical approach for the characterization of ordered 3D nanostructures using grazing-incidence X-ray fluorescence. J Synchrotron Radiat.

Stile di citazione Chicago

Nikolaev, K. V., V. Soltwisch, P. Hönicke, F. Scholze, J. de la Rie, S. N. Yakunin, I. A. Makhotkin, R. W. E. van de Kruijs, e F. Bijkerk. "A Semi-analytical Approach for the Characterization of Ordered 3D Nanostructures Using Grazing-incidence X-ray Fluorescence." J Synchrotron Radiat 2020.

Citazione MLA

Nikolaev, K. V., et al. "A Semi-analytical Approach for the Characterization of Ordered 3D Nanostructures Using Grazing-incidence X-ray Fluorescence." J Synchrotron Radiat 2020.

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