Nikolaev, K. V., Soltwisch, V., Hönicke, P., Scholze, F., de la Rie, J., Yakunin, S. N., . . . Bijkerk, F. (2020). A semi-analytical approach for the characterization of ordered 3D nanostructures using grazing-incidence X-ray fluorescence. J Synchrotron Radiat.
Stile di citazione ChicagoNikolaev, K. V., V. Soltwisch, P. Hönicke, F. Scholze, J. de la Rie, S. N. Yakunin, I. A. Makhotkin, R. W. E. van de Kruijs, e F. Bijkerk. "A Semi-analytical Approach for the Characterization of Ordered 3D Nanostructures Using Grazing-incidence X-ray Fluorescence." J Synchrotron Radiat 2020.
Citazione MLANikolaev, K. V., et al. "A Semi-analytical Approach for the Characterization of Ordered 3D Nanostructures Using Grazing-incidence X-ray Fluorescence." J Synchrotron Radiat 2020.